Researching | High-Resolution Remote-Sensing Change Detection Algorithm Based on Contextual Siam-UNet++

Laser & Optoelectronics Progress, Volume. 62, Issue 8, 0828001(2025)

High-Resolution Remote-Sensing Change Detection Algorithm Based on Contextual Siam-UNet++

Jian Zheng^1,2 and Zihang Xu^1、*

Author Affiliations

¹School of Information Engineering, Jiangxi University of Science and Technology, Ganzhou 341000, Jiangxi , China

²Yichun Lithium New Energy Industry Research Institute, Jiangxi University of Science and Technology, Yichun 336023, Jiangxi , China

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References (24)

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Figures & Tables(8)

Fig. 1. Contextual Siam-UNet++ network model

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Fig. 2. Basic convolutional unit

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Fig. 3. Context transformation module

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Fig. 4. Ensemble attention module

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Fig. 5. Experimental visualization results of LEVIR-CD dataset and WHU dataset

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Fig. 6. Comparison results of ablation experiment

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Table 1. Comparison of experimental results on LEVIR-CD and WHU datasets

Table 1. Comparison of experimental results on LEVIR-CD and WHU datasets

Model	LEVIR-CD					WHU-CD
Model	P	R	F₁	IOU	OA	P	R	F₁	IOU	OA
FC-Siam-EF	86.91	80.17	83.40	71.53	98.39	71.63	67.25	69.37	53.11	97.61
STANet	83.81	91.00	87.26	77.40	98.66	79.37	85.50	82.32	69.95	98.52
SNUNet	89.18	87.17	88.16	78.83	98.82	91.43	87.62	89.48	80.97	99.11
BIT	89.24	89.37	89.31	80.68	98.92	91.76	87.31	89.48	80.96	99.12
VcT	92.57	87.65	90.04	81.89	99.01	89.39	89.77	89.58	81.12	99.18
Proposed	91.70	88.50	90.07	81.93	99.01	93.44	90.97	92.19	85.51	99.24

Table 2. Comparison of ablation test results
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Table 2. Comparison of ablation test results
Model CTM EAM P R F₁ IOU OA
Baseline ✕ ✕ 91.65 90.20 90.92 83.35 99.13
Baseline+CTM √ ✕ 93.37 89.62 91.46 84.26 99.18
Baseline+EAM ✕ √ 92.99 90.12 91.53 84.39 99.20
Proposed √ √ 93.44 90.97 92.19 85.51 99.24

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Jian Zheng, Zihang Xu. High-Resolution Remote-Sensing Change Detection Algorithm Based on Contextual Siam-UNet++[J]. Laser & Optoelectronics Progress, 2025, 62(8): 0828001

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Paper Information

Category: Remote Sensing and Sensors

Received: Aug. 16, 2024

Accepted: Oct. 8, 2024

Published Online: Apr. 3, 2025

The Author Email: Zihang Xu (xuzihangxzh@163.com)

DOI:10.3788/LOP241857

CSTR:32186.14.LOP241857

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology