Journal of Semiconductors, Volume. 40, Issue 12, 120301(2019)

Research status and prospects of deep ultraviolet devices

Hideki Hirayama
Author Affiliations
  • RIKEN, Wako, Saitama 351-0198, Japan
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    Figures & Tables(4)
    (Color online) Schematic illustration of the DUV-LEDs structure.
    (Color online) I–V and edge emission I–L characteristics of the measured UV-C LD. The inset figure shows the edge emission spectrum at 0.5 A forward current[7].
    (Color online) IQE as a function of DD in an underlying layer under weak excitation with excess carrier density of 1 × 1018 cm−3.
    (Color online) Hall-effect temperature-dependent (a) hole concentration, (b) hole mobilities, and (c) hole concentration and mobility measured down to T = 4 K.
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    Hideki Hirayama. Research status and prospects of deep ultraviolet devices[J]. Journal of Semiconductors, 2019, 40(12): 120301

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    Paper Information

    Category: Comments and opinions

    Received: --

    Accepted: --

    Published Online: Sep. 22, 2021

    The Author Email:

    DOI:10.1088/1674-4926/40/12/120301

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