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Photonics Research, Volume. 11, Issue 10, 1657(2023)

Plasmon resonance-enhanced graphene nanofilm-based dual-band infrared silicon photodetector

Xinyu Liu1, Shaoxiong Wu1,2, Xiaoxue Cao1,3, Feng Tian1,2, Srikrishna Chanakya Bodepudi1, Muhammad Malik1, Chao Gao3, Li Peng1,4、*, Huan Hu2,5、*, and Yang Xu1,2,6、*
Author Affiliations
  • 1School of Micro-Nano Electronics, ZJU-Hangzhou Global Scientific and Technological Innovation Center, State Key Laboratory of Silicon and Advanced Semiconductor Materials, Zhejiang University, Hangzhou 310027, China
  • 2ZJU-UIUC Institute, International Campus, Zhejiang University, Haining 314400, China
  • 3Department of Polymer Science and Engineering, MOE Key Laboratory of Macromolecular Synthesis and Functionalization, Key Laboratory of Adsorption and Separation Materials & Technologies of Zhejiang Province, Zhejiang University, Hangzhou 310027, China
  • 4e-mail: l-peng@zju.edu.cn
  • 5e-mail: huanhu@intl.zju.edu.cn
  • 6e-mail: yangxu-isee@zju.edu.cn
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    Article index updated: Feb. 7, 2025

    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 6 article(s) from Web of Science.
    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
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    Xinyu Liu, Shaoxiong Wu, Xiaoxue Cao, Feng Tian, Srikrishna Chanakya Bodepudi, Muhammad Malik, Chao Gao, Li Peng, Huan Hu, Yang Xu, "Plasmon resonance-enhanced graphene nanofilm-based dual-band infrared silicon photodetector," Photonics Res. 11, 1657 (2023)

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    Paper Information

    Category: Optical Devices

    Received: May. 31, 2023

    Accepted: Jul. 30, 2023

    Published Online: Sep. 20, 2023

    The Author Email: Li Peng (l-peng@zju.edu.cn), Huan Hu (huanhu@intl.zju.edu.cn), Yang Xu (yangxu-isee@zju.edu.cn)

    DOI:10.1364/PRJ.496848

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology