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Optical Technique, Volume. 51, Issue 3, 264(2025)

Optimization of the imaging system for detecting invisible defects on the silicon photovoltaic modules under high irradiance level

NIU Jingkai1, ZHAI Shuai2, TIAN Xin2, WEI Lizhong3, WU Wenmin3, and LIAO Ningfang3、*
Author Affiliations
  • 1China Huaneng Clean Energy Research Institute, Beijing 102209, China
  • 2China Huaneng Fengdian Energy Company, Inner Mongolia 013650, China
  • 3National Laboratory of Color Science and Engineering, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
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    NIU Jingkai, ZHAI Shuai, TIAN Xin, WEI Lizhong, WU Wenmin, LIAO Ningfang. Optimization of the imaging system for detecting invisible defects on the silicon photovoltaic modules under high irradiance level[J]. Optical Technique, 2025, 51(3): 264

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    Received: Dec. 30, 2024

    Accepted: May. 29, 2025

    Published Online: May. 29, 2025

    The Author Email: LIAO Ningfang (liaonf@bit.edu.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology