[1] Verspecht J. Broadband sampling oscilloscope characterization the “nose-to-nose” calibration procedure: a theoretical and practical analysis[J]. IEEE Transactions on Instrumentation and Measurement, 44, 991-997(1995). http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=475144

[2] Valdmanis J A, Mourou G A, Gabel C W. Picosecond electro-optic sampling system[J]. Applied Physics Letters, 41, 211-212(1982). http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4851167

[3] Valdmanis J A, Mourou G. Subpicosecond electrooptic sampling: principles and applications[J]. IEEE Journal of Quantum Electronics, 22, 69-78(1986). http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=1072867

[4] Wang Q, Zhang H, Liu N et al. Electro-optic effects induced by the built-in electric field in a {001}-cut silicon crystal[J]. Chinese Optics Letters, 14, 012301(2016). http://www.opticsjournal.net/Articles/Abstract?aid=OJ151224000025aHdKgM

[5] Chen Z G, Zhao J X, Zhang Y H et al. Electric-field-induced linear electro-optic effect in silicon[J]. Acta Optica Sinica, 29, 1336-1340(2009).

[6] Li C S. Mutual compensation property of electrooptic and magnetooptic effects and its application to sensor[J]. Acta Physica Sinica, 64, 047801(2015).

[7] Jepsen P U, Cooke D G, Koch M. Terahertz spectroscopy and imaging-modern techniques and applications[J]. Laser & Photonics Reviews, 5, 124-166(2011). http://core.kmi.open.ac.uk/display/13858077

[8] Blanchard F, Tanaka K. Improving time and space resolution in electro-optic sampling for near field terahertz imaging[J]. Optics Letters, 41, 4645-4648(2016). http://www.ncbi.nlm.nih.gov/pubmed/28005857

[9] Seitz S, Bieler M, Spitzer M et al. Optoelectronic measurement of the transfer function and time response of a 70 GHz sampling oscilloscope[J]. Measurement Science and Technology, 16, L7-L9(2005). http://www.ingentaconnect.com/content/iop/mst/2005/00000016/00000010/art00l02

[10] Lee D J, Kwon J Y, Kang N W. Field analysis of electro-optic probes for minimally invasive microwave sampling[J]. Optics Express, 22, 2897-2909(2014). http://www.opticsinfobase.org/abstract.cfm?URI=oe-22-3-2897

[11] Williams D F, Hale P D, Clement T S et al. Calibrated 200-GHz waveform measurement[J]. IEEE Transactions on Microwave Theory and Techniques, 53, 1384-1389(2005). http://ieeexplore.ieee.org/document/1420770/

[12] Williams D F, Lewandowski A, Clement T S et al. Covariance-based uncertainty analysis of the NIST electrooptic sampling system[J]. IEEE Transactions on Microwave Theory and Techniques, 54, 481-491(2006). http://ieeexplore.ieee.org/document/1573847/

[13] Clement T S, Hale P D, Williams D F et al. Calibration of sampling oscilloscopes with high-speed photodiodes[J]. IEEE Transactions on Microwave Theory and Techniques, 54, 3173-3181(2006). http://ieeexplore.ieee.org/document/1668333/

[14] Loata G C, Bieler M, Gunter H et al. Optically induced voltage pulses by resonant excitation of a passive GaAs photoconductive switch[J]. Journal of the Optical Society of America B, 25, 1261-1264(2008). http://www.opticsinfobase.org/josab/abstract.cfm?uri=josab-25-8-1261

[15] Harper M. Smith A J A, Basu A, et al. Calibration of a 70 GHz oscilloscopes[C]. Conference on Precision Electromagnetic Measurements Digest, 9264258(2004).

[16] Bieler M, Pierz K, Siegner U. Simultaneous generation and detection of ultrashort voltage pulses in low temperature grown GaAs with below-bandgap laser pulses[J]. Applied Physics Letters, 94, 051108(2009). http://scitation.aip.org/content/aip/journal/apl/94/5/10.1063/1.3078288

[17] Füser H, Eichstädt S, Baaske K et al. Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope[J]. Measurement Science and Technology, 23, 025201(2012). http://adsabs.harvard.edu/abs/2012MeScT..23b5201F

[18] Bieler M, Seitz S, Spitzer M et al. Rise-time calibration of 50 GHz sampling oscilloscopes: intercomparison between PTB and NPL[J]. IEEE Transactions on Instrumentation and Measurement, 56, 266-270(2007). http://ieeexplore.ieee.org/document/4126836

[19] Liu M L, Lu F M, Zhu J M et al[M]. Modern pulse metrology(2010).