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Electro-Optic Technology Application, Volume. 40, Issue 3, 30(2025)

High Accuracy Laser Triangulation Measurement Based on Dual-Wavelength Illumination

WANG Junguang1, ZHAO Zhecheng2, CHEN Xinhua3,4, and SHEN Weimin3,4
Author Affiliations
  • 1Academy of Opto-Electronics, China Electronics Technology Group Corporation (AOE CETC), Tianjin, China
  • 2Suzhou PLS Technology Co., LTD., Suzhou, China
  • 3School of Optoelectronic Science and Engineering, Soochow University, Suzhou, China
  • 4Key Laboratory of Modern Optical Technologies of Education Ministry of China, Suzhou, China
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    WANG Junguang, ZHAO Zhecheng, CHEN Xinhua, SHEN Weimin. High Accuracy Laser Triangulation Measurement Based on Dual-Wavelength Illumination[J]. Electro-Optic Technology Application, 2025, 40(3): 30

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    Paper Information

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    Received: Jan. 23, 2025

    Accepted: Sep. 5, 2025

    Published Online: Sep. 5, 2025

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology