Electro-Optic Technology Application, Volume. 40, Issue 3, 30(2025)

High Accuracy Laser Triangulation Measurement Based on Dual-Wavelength Illumination

WANG Junguang1, ZHAO Zhecheng2, CHEN Xinhua3,4, and SHEN Weimin3,4
Author Affiliations
  • 1Academy of Opto-Electronics, China Electronics Technology Group Corporation (AOE CETC), Tianjin, China
  • 2Suzhou PLS Technology Co., LTD., Suzhou, China
  • 3School of Optoelectronic Science and Engineering, Soochow University, Suzhou, China
  • 4Key Laboratory of Modern Optical Technologies of Education Ministry of China, Suzhou, China
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    Laser speckle is one of the main sources of noise in the measurement process of laser triangulation measurement, which significantly impacts the measurement uncertainty of triangulation measurement instruments. A triangulation measurement device taking two lasers with different wavelengths as the light sources is proposed to suppress the speckle phenomenon during testing and improve the measurement accuracy of the instrument. At first, the working principle of laser triangulation measurement and the relationship between speckle and the measurement uncertainty of the device are introduced. And then, the principle of using dual-wavelength illumination to suppress speckle and improve the accuracy of triangulation measurements is introduced, and the speckle suppression effects under different power ratios of light sources are analyzed. At last, lasers with wavelengths of 405 nm and 420 nm are used to conduct triangulation measurement experiment. Experimental results indicate that the method can reduce the measurement uncertainty of the theodolite. After illumination with a dual-wavelength light source, the instrument's testing uncertainty decreases from 0.52 μm to 0.23 μm. The measurement uncertainty can be reduced, which lays the technical groundwork for the development of higher precision laser triangulation instruments and possesses important practical value.

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    WANG Junguang, ZHAO Zhecheng, CHEN Xinhua, SHEN Weimin. High Accuracy Laser Triangulation Measurement Based on Dual-Wavelength Illumination[J]. Electro-Optic Technology Application, 2025, 40(3): 30

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    Paper Information

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    Received: Jan. 23, 2025

    Accepted: Sep. 5, 2025

    Published Online: Sep. 5, 2025

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