Frontiers of Optoelectronics, Volume. 10, Issue 2, 151(2017)

Defect detection on button surfaces with the weighted least-squares model

Yu HAN, Yubin WU, Danhua CAO*, and Peng YUN
Author Affiliations
  • School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China
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    Yu HAN, Yubin WU, Danhua CAO, Peng YUN. Defect detection on button surfaces with the weighted least-squares model[J]. Frontiers of Optoelectronics, 2017, 10(2): 151

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    Paper Information

    Category: RESEARCH ARTICLE

    Received: Dec. 22, 2016

    Accepted: Mar. 9, 2017

    Published Online: Jan. 17, 2018

    The Author Email: Danhua CAO (dhcao@hust.edu.cn)

    DOI:10.1007/s12200-017-0687-7

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