Diffraction Intensity Distribution of Pinhole for Misaligned Gaussian Beam Incidence

Tong Zhang; Fen Gao; Bing Li; Ailing Tian

doi:10.3788/LOP202158.1905001

Laser & Optoelectronics Progress, Volume. 58, Issue 19, 1905001(2021)

Diffraction Intensity Distribution of Pinhole for Misaligned Gaussian Beam Incidence

Tong Zhang¹, Fen Gao^1,2、*, Bing Li², and Ailing Tian¹

Author Affiliations

¹School of Optoelectronic and Engineering, Xi'an Technological University, Xi'an , Shaanxi 710021, China

²State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an , Shaanxi 710049, China

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Tong Zhang, Fen Gao, Bing Li, Ailing Tian. Diffraction Intensity Distribution of Pinhole for Misaligned Gaussian Beam Incidence[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1905001

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Paper Information

Category: Diffraction and Gratings

Received: Dec. 15, 2020

Accepted: Dec. 27, 2020

Published Online: Sep. 29, 2021

The Author Email: Fen Gao (gaofen8128@163.com)

DOI:10.3788/LOP202158.1905001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology