Laser & Optoelectronics Progress, Volume. 58, Issue 5, 0504002(2021)

Monte Carlo Simulation Affecting PSSD Position Resolution Factors

Haisheng Song1, Caixia Dong1,2, Defang Niu1,2, Kai Zhuang2,3, Ting Li2,3, Xiubo Qin2,4、*, Penghao Liu2, Xiongbin Yang2, and Yuxiong Xue5
Author Affiliations
  • 1College of Physics and Electronic Engineering, Northwest Normal University, Lanzhou , Gansu 730000, China
  • 2Beijing Engineering Research Center of Radiographic Techniques and Equipment, Institute of High Energy Physics Chinese Academy of Sciences, Beijing 100049, China
  • 3School of Nuclear Science and Technology, University of Chinese Academy of Sciences, Beijing 100049, China
  • 4X Lab, the Second Academy of China Aerospace Science and Industry Corporation Limited, Beijing100049, China
  • 5Science and Technology on Vacuum and Physics Laboratory, Lanzhou Institute of Physics, Lanzhou , Gansu 730000, China
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    Figures & Tables(9)
    Schematic of electron incidence
    Range of interaction between electrons and matter
    Distribution curve of position detected by detector
    FWHM of electron position distribution at different energies
    Electron penetration at different energies
    Position resolution of detectors with different thickness
    Location distribution under 4 mm2 sensitive area. (a) Color map of location distribution; (b) profile of location distribution
    Location distribution under 16 mm2 sensitive area. (a) Color map of location distribution; (b) profile of location distribution
    Electron position distribution curves at different energies. (a) 30 keV; (b) 600 keV; (c) 2.5 MeV; (d) 5.8 MeV
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    Haisheng Song, Caixia Dong, Defang Niu, Kai Zhuang, Ting Li, Xiubo Qin, Penghao Liu, Xiongbin Yang, Yuxiong Xue. Monte Carlo Simulation Affecting PSSD Position Resolution Factors[J]. Laser & Optoelectronics Progress, 2021, 58(5): 0504002

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    Paper Information

    Category: Detectors

    Received: Jun. 9, 2020

    Accepted: Aug. 3, 2020

    Published Online: Apr. 19, 2021

    The Author Email: Xiubo Qin (qinxb@ihep.ac.cn)

    DOI:10.3788/LOP202158.0504002

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