Acta Optica Sinica, Volume. 39, Issue 9, 0911002(2019)

Simplified Analytical Method for Error Sources in Mueller Matrix Imaging Polarimeter

Zejiang Meng1,2, Sikun Li1,2、*, Xiangzhao Wang1,2、**, Yang Bu1,2, Fengzhao Dai1,2, and Chaoxing Yang1,2
Author Affiliations
  • 1 Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(13)
    Structure of Mueller matrix imaging polarimeter for measuring polarization aberration
    Original Jones pupil. (a) Polarization attenuation; (b) phase delay
    Statistics of prediction errors by using model of delay error of retarder. (a) Mean value; (b) standard deviation
    Statistics of prediction errors by using model of polarization attenuation error of retarder. (a) Mean value; (b) standard deviation
    Statistics of prediction errors by using model of azimuthal-angle error of retarder. (a) Mean value; (b) standard deviation
    Statistics of error distribution of Mueller matrix caused by two kinds of random error sources. (a) Image sensor noise; (b) random azimuthal-angle errors of retarders
    Relationship between original and predicted intensity errors and random azimuthal-angle error of retarder
    Errors of Mueller matrix caused by noise of image sensor. (a) Original values; (b) predicted values
    Errors of Mueller matrix caused by random azimuthal-angle errors of retarders. (a) Original values; (b) predicted values
    • Table 1. Error sources in Mueller matrix imaging polarimeter

      View table

      Table 1. Error sources in Mueller matrix imaging polarimeter

      Error typeElementError parameterTypical value
      Quarter-wave platesRetardance error δ0.001π
      Q1, Q2Diattenuation error ε0.01
      SystematicAzimuthal angle error Δθ /(°)0.1
      PolarizersDiattenuation error ε0.01
      P1, P2Retardance error δ0.001π
      Azimuthal angle error Δθ /(°)0.1
      RandomImage sensor CCDNoise σI)0.003
      (normal distribution)Q1, Q2Azimuthal angle error σθR) /(°)0.1
    • Table 2. Fourier coefficients of light intensity influenced by delay errorof retarder

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      Table 2. Fourier coefficients of light intensity influenced by delay errorof retarder

      OrderTermCoefficient of Fourier seriesApproximate coefficient
      01m11/4+(1-s1) (m12+m21)/8+(1-s1)2m22/16m11/4+(1-s1) (m12+m21)/8+(1-2s1) m22/16
      1cos(2θ)00
      2sin(2θ)-c1m14/4-c1 (1-s1) m24/8-m14/4-(1-s1) m24/8
      3cos(2)00
      4sin(2)c1m41/4+c1 (1-s1) m42/8m41/4+(1-s1) m42/8
      5cos[2(1+k)θ]c12m44/8m44/8
      6sin[2(1+k)θ]00
      7cos[2(1-k)θ]-c12m44/8-m44/8
      8sin[2(1-k)θ]00
      9cos(4θ)(1-s12) m22/16+(1+s1) m12/8m22/16+(1+s1) m12/8
      10sin(4θ)(1-s12) m23/16+(1+s1) m13/8m23/16+(1+s1) m13/8
      11cos(4)(1-s12) m22/16+(1+s1) m21/8m22/16+(1+s1) m21/8
      12sin(4)(1-s12) m32/16+(1+s1) m31/8m32/16+(1+s1) m31/8
      13cos[4(1+k)θ](1+s1)2 (m22-m33)/32(1+2s1) (m22-m33)/32
      14sin[4(1+k)θ](1+s1)2 (m23+m32)/32(1+2s1) (m23+m32)/32
      15cos[4(1-k)θ](1+s1)2 (m22+m33)/32(1+2s1) (m22+m33)/32
      16sin[4(1-k)θ](1+s1)2 (m23-m32)/32(1+2s1) (m23-m32)/32
      17cos[2(1+2k)θ]c1 (1+s1) m34/16(1+s1) m34/16
      18sin[2(1+2k)θ]-c1 (1+s1) m24/16-(1+s1) m24/16
      19cos[2(1-2k)θ]-c1 (1+s1) m34/16-(1+s1) m34/16
      20sin[2(1-2k)θ]-c1 (1+s1) m24/16-(1+s1) m24/16
      21cos[2(2+k)θ]-c1 (1+s1) m43/16-(1+s1) m43/16
      22sin[2(2+k)θ]c1 (1+s1) m42/16(1+s1) m42/16
      23cos[2(2-k)θ]c1 (1+s1) m43/16(1+s1) m43/16
      24sin[2(2-k)θ]-c1 (1+s1) m42/16-(1+s1) m42/16
    • Table 3. Fourier coefficients of light intensity influenced by diattenuation and azimuthal-angle error of retarder

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      Table 3. Fourier coefficients of light intensity influenced by diattenuation and azimuthal-angle error of retarder

      OrderTermApproximate coefficient (ε)Approximate coefficient (θ)
      01(1-2s2) (m11/4+(m12+m21)/8+m22/16)m11/4+(m12+m21)/8+m22/16
      1cos(2θ)s2 (m11/4+m12/4+m21/8+m22/8)-s3 (m14/4+m24/8)
      2sin(2θ)-(m14/4+m24/8)+s2 (m14/2+m24/4+m13/4+m23/8)-(m14/4+m24/8)
      3cos(2)s2 (m11/4+m21/4+m12/8+m22/8)s3 (m41/4+m42/8)
      4sin(2)(m41/4+m42/8)-s2 (m41/2+m42/4-m31/4-m32/8)(m41/4+m42/8)
      5cos[2(1+k)θ]m44/8-s2 (m44/4-m34/8+m43/8)m44/8
      6sin[2(1+k)θ]-s2 (m14/8+m24/8-m41/8-m42/8)-s3m44/4
      7cos[2(1-k)θ]-m44/8+s2 (m44/4-m34/8+m43/8)-m44/8
      8sin[2(1-k)θ]-s2 (m14/8+m24/8+m41/8+m42/8)0
      9cos(4θ)(1-2s2) (m12/8+m22/16)(m12/8+m22/16)+s3 (m13/4+m23/8)
      10sin(4θ)(1-2s2) (m13/8+m23/16)(m13/8+m23/16)-s3 (m12/4+m22/8¯)
      11cos(4)(1-2s2) (m21/8+m22/16)(m21/8+m22/16)+s3 (m31/4+m32/8)
      12sin(4)(1-2s2) (m31/8+m32/16)(m31/8+m32/16)-s3 (m21/4+m22/8¯)
      13cos[4(1+k)θ](1-2s2) (m22-m33)/32(m22-m33)/32+s3 (m23+m32)/8
      14sin[4(1+k)θ](1-2s2) (m23+m32)/32(m23+m32)/32-s3 (m22-m33)/8
      15cos[4(1-k)θ](1-2s2) (m22+m33)/32(m22+m33)/32
      16sin[4(1-k)θ](1-2s2) (m23-m32)/32(m23-m32)/32
      17cos[2(1+2k)θ]m34/16-s2 (m34/8+m33/16¯-m21/16-m22/16)m34/16-3s3m24/16
      18sin[2(1+2k)θ]-m24/16+s2 (m24/8+m23/16+m31/16+m32/16)-m24/16-3s3m34/16
      19cos[2(1-2k)θ]-m34/16+s2 (m34/8+m33/16¯+m21/16+m22/16)-m34/16+s3m24/16
      20sin[2(1-2k)θ]-m24/16+s2 (m24/8+m23/16-m31/16-m32/16)-m24/16-s3m34/16
      21cos[2(2+k)θ]-m43/16+s2 (m43/8-m33/16¯+m12/16+m22/16)-m43/16+3s3m42/16
      22sin[2(2+k)θ]m42/16-s2 (m42/8-m32/16-m13/16-m23/16)m42/16+3s3m43/16
      23cos[2(2-k)θ]m43/16-s2 (m43/8-m33/16¯-m12/16-m22/16)m43/16-s3m42/16
      24sin[2(2-k)θ]-m42/16+s2 (m42/8-m32/16+m13/16+m23/16)-m42/16-s3m43/16
    • Table 4. Angle configuration of polarization element

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      Table 4. Angle configuration of polarization element

      ConfigurationAngle of P1θ1 /(°)Angle of Q1ϕ1 /(°)Angle of Q2ϕ2 /(°)Angle of P2θ2 /(°)
      1×144×100, 1.25, 2.5, …, 178.756ϕ10
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    Zejiang Meng, Sikun Li, Xiangzhao Wang, Yang Bu, Fengzhao Dai, Chaoxing Yang. Simplified Analytical Method for Error Sources in Mueller Matrix Imaging Polarimeter[J]. Acta Optica Sinica, 2019, 39(9): 0911002

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    Paper Information

    Category: Imaging Systems

    Received: Apr. 17, 2019

    Accepted: May. 21, 2019

    Published Online: Sep. 9, 2019

    The Author Email: Li Sikun (lisikun@siom.ac.cn), Wang Xiangzhao (wxz26267@siom.ac.cn)

    DOI:10.3788/AOS201939.0911002

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