Lensless imaging through thin scattering layers under broadband illumination

Wei Li; Bingjian Wang; Tengfei Wu; Feihu Xu; Xiaopeng Shao

doi:10.1364/PRJ.466065

Photonics Research, Volume. 10, Issue 11, 2471(2022)

Lensless imaging through thin scattering layers under broadband illumination

Wei Li¹, Bingjian Wang², Tengfei Wu³, Feihu Xu⁴, and Xiaopeng Shao^1、*

Author Affiliations

¹School of Optoelectronic Engineering, Xidian University, Xi’an 710071, China

²School of Physics, Xidian University, Xi’an 710071, China

³Laboratoire Kastler Brossel, ENS–Université PSL, CNRS, Sorbonne Université, College de France, F-75005 Paris, France

⁴Hefei National Laboratory for Physical Sciences at Microscale and School of Physical Science, University of Science and Technology of China, Hefei 230026, China

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Supplementary Materials

Visualization 1 | Visualization 1 includes four parts. Part I presents the speckle evolution of both monochromatic and polychromatic speckles under the illumination bandwidth ranging from ? = 500 nm to ? = 764 nm. Part II shows the speckle autocorrelation changes with

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Wei Li, Bingjian Wang, Tengfei Wu, Feihu Xu, Xiaopeng Shao, "Lensless imaging through thin scattering layers under broadband illumination," Photonics Res. 10, 2471 (2022)

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Paper Information

Category: Image Processing and Image Analysis

Received: Jun. 7, 2022

Accepted: Aug. 2, 2022

Published Online: Oct. 8, 2022

The Author Email: Xiaopeng Shao (xpshao@xidian.edu.cn)

DOI:10.1364/PRJ.466065

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology