[1] [1] YI C. Review and prospect of HgCdTe detectors[J]. Infrared and Laser Engineering, 2022, 51(1): 20210988-1-20210988-13.

[4] [4] Arkun F Erdem, Edwall Dennis D, Ellsworth Jon, et al. Characterization of HgCdTe films grown on large-area CdZnTe substrates by molecular beam epitaxy[J]. Journal of Electronic Materials, 2017, 46(9): 5374-5378.

[5] [5] Mosby G, Rauscher B J, Bennett C, et al. Properties and characteristics of the WFIRST H4RG-10 detectors[J/OL]. Physics, 2020: DOI: 10.48550/arXiv.2005.00505, https://doi.org/10.48550/arXiv.2005.00505.

[7] [7] Reddy M, JIN X, Lofgreen D, et al. Demonstration of high-quality MBE HgCdTe on 8-Inch wafers[J]. Journal of Electronic Materials, 2019, 48(10): 6040-6044.

[9] [9] Santailler J L, Gout E, Journot T, et al. From 5” CdZnTe ingots to high quality (111) CdZnTe substrates for SWIR 2K2 15 μm pitch infrared focal plane arrays manufacturing[C]//Infrared Technology and Applications XLVI of SPIE, 2020, 11407: 19-31.

[10] [10] Wenisch J, Bitterlich H, Bruder M, et al. Large-format and long-wavelength infrared mercury cadmium telluride detectors[J]. Journal of Electronic Materials, 2013, 42: 3186-3190.