Fig. 1. (a) Raw spectrum of light source obtained by standard instrument; (b) Relative power spectrum after radiation-based spectral correction; (c) Raw spectrum of light source obtained by SPR measurement system; (d) Relative instrument response function of SPR system

Fig. 2. (a) Raw SPR resonance spectrum and its radiation spectrum and corresponding fitting curve;(b) Relative reflectance curves of conventional correction method and our radiation-based method

Fig. 3. (a) SPR raw spectra under different incident angles; (b) corrected by radiation-based method; (c) corrected by conventional method

Fig. 4. Resonance wavelengths of 4 000 SPR spectra obtained continuously

Fig. 5. (a) SPR relative reflectance spectra at different concentrations corrected by radiation-based correction and (b) conventional correction; (c) Sensitivity curve of refractive index based on conventional correction (black) and radiation-based correction (red)

Fig. 6. (a) Reflectance spectra corrected by radiation-based method at different times during the adsorption; (b) Resonance wavelength shift versus adsorption time