Acta Photonica Sinica, Volume. 54, Issue 3, 0331002(2025)
Development of Highly Surface Phase-modulated Reflection Elements for Quantum Key Distribution Systems
Fig. 11. RMS The amount of RMS changes before and after SiO2 deposition
Fig. 13. Reflective surface profile after deposition of 4 805 nm SiO2
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Yonggang PAN, Youde WANG, Xiuhua FU, Zhaowen LIN, Xin DU, Haifeng XIE, Peng SHI. Development of Highly Surface Phase-modulated Reflection Elements for Quantum Key Distribution Systems[J]. Acta Photonica Sinica, 2025, 54(3): 0331002
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Received: Aug. 1, 2024
Accepted: Dec. 16, 2024
Published Online: Apr. 22, 2025
The Author Email: Youde WANG (qq755547058@163.com)