Acta Photonica Sinica, Volume. 54, Issue 3, 0331002(2025)

Development of Highly Surface Phase-modulated Reflection Elements for Quantum Key Distribution Systems

Yonggang PAN1,2, Youde WANG1,2、*, Xiuhua FU1,2, Zhaowen LIN2,3, Xin DU1,2, Haifeng XIE1,2, and Peng SHI4
Author Affiliations
  • 1College of Optoelectronic Engineering,Changchun University of Science and Technology,Changchun 130022,China
  • 2Zhongshan Research Institute,Changchun University of Science and Technology,Zhongshan 528436,China
  • 3Zhongshan Jilian Optoelectronic Technology Co.,Ltd.,Zhongshan 528436,China
  • 4Zhongshan Torch Vocational and Technical College,Zhongshan 528436,China
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    Figures & Tables(15)
    Schematic of membrane layer structure
    Reflectance spectral curves
    Phase difference curve
    Layer sensitivity
    Effect of thick film thickness on phase difference
    Reflectance spectral curve
    SEM measurement image
    Phase difference curve
    Reflective surface curve
    RMS before and after SiO2 deposition
    RMS The amount of RMS changes before and after SiO2 deposition
    Linear fit curve
    Reflective surface profile after deposition of 4 805 nm SiO2
    • Table 1. Technical requirements for reflective elements

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      Table 1. Technical requirements for reflective elements

      ParameterSpecification
      SubstrateCorning 7980 0F
      Incident angle45°
      Wavelength1 540 nm & 1 563 nm
      ReflectanceRs≥99% & Rp≥99%
      Reflectance phase≤1.5°
      RMSλ/50(λ=632.8 nm)
      Installation requirementsR≥80%(@632.8 nm ±5 nm)
      Environmental adaptationWater solubility test,adhesion test,temperature shock test,damp heat test
    • Table 2. Process parameters for the preparation of phase-modulated reflective films

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      Table 2. Process parameters for the preparation of phase-modulated reflective films

      Project

      Deposition

      Rate/nm·s-1

      EB

      Oxygenation/sccm

      IBS
      Voltage/VCurrent/mAFlow/sccm
      IB Cleaning7507508(Ar),50(O2
      Ta2O50.4301 1009508(Ar),50(O2
      SiO20.801 1009508(Ar),50(O2
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    Yonggang PAN, Youde WANG, Xiuhua FU, Zhaowen LIN, Xin DU, Haifeng XIE, Peng SHI. Development of Highly Surface Phase-modulated Reflection Elements for Quantum Key Distribution Systems[J]. Acta Photonica Sinica, 2025, 54(3): 0331002

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    Paper Information

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    Received: Aug. 1, 2024

    Accepted: Dec. 16, 2024

    Published Online: Apr. 22, 2025

    The Author Email: Youde WANG (qq755547058@163.com)

    DOI:10.3788/gzxb20255403.0331002

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