Acta Optica Sinica, Volume. 44, Issue 11, 1112001(2024)

Full-Field Thickness-Direction Strain Measurement Based on Multispectral Digital Image Correlation

Huatao Zhao, Xinqiao Tang, and Zhenning Chen*
Author Affiliations
  • College of Aerospace Engineering, Nanjing University of Aeronautics & Astronautics, Nanjing 210016, Jiangsu , China
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    Figures & Tables(10)
    Schematic of the measuring device. (a) Single camera multispectral measurement system; (b) traditional four-camera measurement system
    Refraction correction model
    Flow chart of system calibration and 3D reconstruction
    Schematic of strain measurement along thickness direction. (a)(b) Local coordinate system and its enlarged view; (c) front and back surfaces with the same calculated areas
    Thin plate morphology. (a) Three-dimensional morphology of 3.3 mm thin plate; (b) three-dimensional morphology of 4.3 mm thin plate; (c) semi-cylindrical three-dimensional morphology
    Experimental setup diagram. (a) Experimental setup; (b) experimental specimen
    Real time speckle image. (a) Color image; (b) blue and red channel subimages; (c) two subimages of the left image; (d) two subimages of the right image
    Full-field strain along thickness direction. (a) Strain distribution along thickness direction at T1=153 s; (b) strain distribution along thickness direction at T2=173 s; (c) strain distribution along thickness direction at T3=193 s
    Trend of strain variation along thickness direction. (a) Distribution of calculation points; (b) strain-time curves along thickness direction
    • Table 1. Sheet thickness

      View table

      Table 1. Sheet thickness

      Measured thickness /mmThickness before correction /mmThickness after correction /mm
      0.980.650.98
      3.312.163.30
      4.292.834.25
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    Huatao Zhao, Xinqiao Tang, Zhenning Chen. Full-Field Thickness-Direction Strain Measurement Based on Multispectral Digital Image Correlation[J]. Acta Optica Sinica, 2024, 44(11): 1112001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 4, 2024

    Accepted: Mar. 8, 2024

    Published Online: Jun. 17, 2024

    The Author Email: Chen Zhenning (zhenning.chen@nuaa.edu.cn)

    DOI:10.3788/AOS240446

    CSTR:32393.14.AOS240446

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