[2] [2] Xie H, Sun B, Zhu X. Journal of Hazardous Materials, 2009, 168(2): 765.

[3] [3] Wang B, Sun B, Zhu X, et al. Contributions to Plasma Physics, 2013, 53(9): 697.

[4] [4] Rahim I, Nomura S, Mukasa S, et al. Applied Thermal Engineering, 2015, 90: 120.

[5] [5] Nomura S, Toyota H. Applied Physics Letters, 2003, 83(22): 4503.

[6] [6] Mukasa S, Maehara T, Nomura S, et al. International Journal of Heat and Mass Transfer, 2010, 53(15): 3067.

[7] [7] Mukasa S, Nomura S, Toyota H. Japanese Journal of Applied Physics, 2004, 43(5S): 2833.

[8] [8] Beenakker C I M, De Heer F J, Krop H B, et al. Chemical Physics, 1974, 6(3): 445.

[9] [9] Sun B, Sato M, Clements J S. Journal of Electrostatics, 1997, 39(3): 189.

[10] [10] Liu Y, Sun B, Wang L, et al. Plasma Chemistry and Plasma Processing, 2012, 32(2): 359.

[11] [11] Petrie W, Monaghan P A, Dolan P A. Canadian Journal of Research, 1949, 27(6): 213.

[13] [13] http://physics.nist.gov/PhysRefData/ASD/lines_form.html