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Optical Technique, Volume. 51, Issue 3, 309(2025)

Research on terahertz testing for crack defects in high voltage ceramic sleeve

CHEN Siyang1, ZHAI Di2, WANG Hao1, and ZHANG Zhenwei2、*
Author Affiliations
  • 1State grid Ningxia Ultrahigh Voltage Company, Ningxia 750011, China
  • 2China Electric Power Research Institute Co., Ltd, Beijing 102209, China
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    CHEN Siyang, ZHAI Di, WANG Hao, ZHANG Zhenwei. Research on terahertz testing for crack defects in high voltage ceramic sleeve[J]. Optical Technique, 2025, 51(3): 309

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    Paper Information

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    Received: Jan. 16, 2025

    Accepted: May. 29, 2025

    Published Online: May. 29, 2025

    The Author Email: ZHANG Zhenwei (zhangzw_cnu@163.com)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology