Optical Technique, Volume. 51, Issue 3, 309(2025)

Research on terahertz testing for crack defects in high voltage ceramic sleeve

CHEN Siyang1, ZHAI Di2, WANG Hao1, and ZHANG Zhenwei2、*
Author Affiliations
  • 1State grid Ningxia Ultrahigh Voltage Company, Ningxia 750011, China
  • 2China Electric Power Research Institute Co., Ltd, Beijing 102209, China
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    Terahertz waves demonstrate exceptional penetration capabilities in non-polar materials, with terahertz echo imaging generated by internal dielectric discontinuities offering high resolution and non-contact operation. These characteristics position terahertz technology as a research priority for field-based non-destructive testing of insulation components like high-voltage ceramic bushings. This study introduces theoretical models for terahertz wave transmission and reflection, presenting systematic methodologies for extracting material dielectric parameters using both transmission and reflection approaches. Through scanning imaging, the thickness distribution of the anti-pollution flashover coating on the external surface of the high-voltage ceramic sleeve specimen is detected, and the prefabricated gap defects inside the ceramic are also identified. This research demonstrates terahertz imaging's dual capability for surface coating evaluation and subsurface defect detection in high-voltage insulation components.

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    CHEN Siyang, ZHAI Di, WANG Hao, ZHANG Zhenwei. Research on terahertz testing for crack defects in high voltage ceramic sleeve[J]. Optical Technique, 2025, 51(3): 309

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    Paper Information

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    Received: Jan. 16, 2025

    Accepted: May. 29, 2025

    Published Online: May. 29, 2025

    The Author Email: ZHANG Zhenwei (zhangzw_cnu@163.com)

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