Chinese Journal of Lasers, Volume. 46, Issue 8, 0803001(2019)

Time-Resolved Investigation of Multiple-Pulse Laser-Induced Bulk Damage in Fused Silica

Zhen Cao1,2, Hongbo He3、*, Guohang Hu3、**, Yuanan Zhao3, and Jianda Shao1,3
Author Affiliations
  • 1 Advanced Optical Manufacturing and Testing Center, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences,Beijing 100049, China
  • 3 Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences, Shanghai 201800, China
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    Figures & Tables(7)
    Schematic of time-resolved laser photometer
    Bulk damage probability curves in thick fused silica by using S-on-1 test method
    Images captured by CCD. Images after successive (a) 1st pulse, (b) 2nd pulse, and (c) 3rd pulse irradiation at laser power density of 200 GW·cm-2 (arrow indicates incident direction of 355 nm laser); (d) plasma emission image under CCD integration time of 100 ms
    Typical damage morphology in thick fused silica (arrow indicates incident direction of 355 nm laser)
    Real-time variation of each signal during multi-pulse irradiation of thick fused silica at laser power density of 97 GW·cm-2. (a) 1st pluse; (b) 20th pluse; (c) 67th pluse
    Real-time variation of each signal during multi-pulse irradiation of thick fused silica at laser power density of 133 GW·cm-2. (a) 1st pluse; (b) 3rd pluse; (c) 6th pluse
    Reflectivity, transmission loss, and pulse number required for inducing damage versus laser power density
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    Zhen Cao, Hongbo He, Guohang Hu, Yuanan Zhao, Jianda Shao. Time-Resolved Investigation of Multiple-Pulse Laser-Induced Bulk Damage in Fused Silica[J]. Chinese Journal of Lasers, 2019, 46(8): 0803001

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    Paper Information

    Category: materials and thin films

    Received: Dec. 26, 2018

    Accepted: Feb. 18, 2019

    Published Online: Aug. 13, 2019

    The Author Email: He Hongbo (hbhe@siom.ac.cn), Hu Guohang (hbhe@siom.ac.cn)

    DOI:10.3788/CJL201946.0803001

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