Acta Photonica Sinica, Volume. 53, Issue 2, 0212001(2024)
Method for Refractive Index Uniformity Measurement Based on Two-flat and Three-flat Test
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Zhiyao MA, Donghui ZHENG, Lei CHEN, Jun MA. Method for Refractive Index Uniformity Measurement Based on Two-flat and Three-flat Test[J]. Acta Photonica Sinica, 2024, 53(2): 0212001
Category: Instrumentation, Measurement and Metrology
Received: Jul. 25, 2023
Accepted: Sep. 11, 2023
Published Online: Mar. 28, 2024
The Author Email: Donghui ZHENG (zdonghui@njust.edu.cn)