Acta Photonica Sinica, Volume. 53, Issue 2, 0212001(2024)

Method for Refractive Index Uniformity Measurement Based on Two-flat and Three-flat Test

Zhiyao MA, Donghui ZHENG*, Lei CHEN, and Jun MA
Author Affiliations
  • Nanjing University of Science and Technology,School of Electronic and Optical Engineering,Nanjing 210094,China
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    References(17)

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    Zhiyao MA, Donghui ZHENG, Lei CHEN, Jun MA. Method for Refractive Index Uniformity Measurement Based on Two-flat and Three-flat Test[J]. Acta Photonica Sinica, 2024, 53(2): 0212001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 25, 2023

    Accepted: Sep. 11, 2023

    Published Online: Mar. 28, 2024

    The Author Email: Donghui ZHENG (zdonghui@njust.edu.cn)

    DOI:10.3788/gzxb20245302.0212001

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