[1] [1] J. C. Mullikin, L. J. van Vliet, H. Netten et al.. Methods for CCD camera characterization［C］. SPIE, 1994, 2173: 73～84

[2] [2] Ralf Widenhorn, Lars Mundermann, Armin Rest et al.. Meyer-Neldel rule for dark current in charge-coupled device［J］. J. Appl. Phys., 2001, 89(2): 8179～8182

[3] [3] Ralf Widenhorn, Ines Hartwig, Justin C. Dunlap et al.. Measurement of dark current in a CCD imager during light exposure［C］. SPIE, 2008, 6816: 68160B

[4] [4] Richard L. Baer. A model for dark current characterization and simulation［C］. SPIE, 2006, 6068: 606805

[5] [5] Ren Huanhuan, Yuan Ping, He Jianwei et al.. Study of the radiation calibration of TDI-CCD spatial stereo camera［J］. Acta Optica Sinica, 2008, 28(1): 99～104

[6] [6] Song Zongxi, Zhao Baochang, Gao Wei et al.. Focal plane design of Chang′e-1 satellite CCD stereo-camera and laboratory radiation calibration［J］. Acta Optica Sinica, 2010, 30(12): 3508～3514

[7] [7] Liu Jun, Zhao Jinbin, Liu Weijun et al.. Gene chip microarray fluorescent spots images CCD scanning and acquiring system［J］. Chinese J. Lasers, 2010, 37(2): 505～509

[8] [8] J. R. Janesick. Scientific Charge-Coupled Devices [M]. Bellingham: SPIE Press, 2001.105～106

[9] [9] Ding Xiaohua, Li You, Yu Qifeng et al.. CCD noise calibration and its application in edge location［J］. Acta Optica Sinica, 2008, 28(1): 99～104

[10] [10] Zhang Huige, Wang Zhebin, Zhang Wenhai. Linearity slope and nonlinear scale for CCD sampling and collecting system［J］. High Power Laser and Particle Beams, 2008, 20(8): 1313～1316