Spectroscopy and Spectral Analysis, Volume. 43, Issue 5, 1563(2023)
Investigation of Novel Method for Detecting Vanillin Based on X-Ray Diffraction Technology
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SHI Zhi-feng1, LIU Jia, XIAO Juan, ZHENG Zhi-wen. Investigation of Novel Method for Detecting Vanillin Based on X-Ray Diffraction Technology[J]. Spectroscopy and Spectral Analysis, 2023, 43(5): 1563
Received: Feb. 25, 2022
Accepted: --
Published Online: Jan. 7, 2024
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