Acta Optica Sinica, Volume. 42, Issue 20, 2013001(2022)

Delay Measurement Stability of Silicon-Based Optical Switching Delay Line Chip

Shangqing Shi, Pengcheng Liu, and Binfeng Yun*
Author Affiliations
  • Advanced Photonics Center, Southeast University, Nanjing 210096, Jiangsu , China
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    Figures & Tables(5)
    Structural diagram of OVNA delay measurement link based on optical double sideband modulation
    Structural diagrams of silicon based optical switching delay line chip and modules. (a) Structural diagram of 5-bit optical switching delay line; (b) structural diagram of alignment waveguide; (c) mask layout of delay line chip; (d) picture of chip coupling package module
    Delay measurement results of OVNA delay test link, alignment waveguide and delay line. (a) Relation between delay fluctuation and GRF; (b) relation between standard deviation of delay fluctuation and GRF
    Transmission spectra of OVNA delay test link, alignment waveguide and delay line near wavelength of 1560 nm
    Delay measurement results of 5-bit silicon based optical switching delay line chip. (a) Relative delay values of 32 delay states; (b) standard deviations of delay fluctuations of 32 delay states
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    Shangqing Shi, Pengcheng Liu, Binfeng Yun. Delay Measurement Stability of Silicon-Based Optical Switching Delay Line Chip[J]. Acta Optica Sinica, 2022, 42(20): 2013001

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    Paper Information

    Category: Integrated Optics

    Received: Mar. 1, 2022

    Accepted: Apr. 27, 2022

    Published Online: Oct. 18, 2022

    The Author Email: Yun Binfeng (ybf@seu.edu.cn)

    DOI:10.3788/AOS202242.2013001

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