[1] [1] James R. Lemen, Dexter Duncan, Christopher Edwards et al.. The solar X-ray imager for GOES［C］. SPIE, 2004, 5171: 65～76

[2] [2] Li Baoquan, Zhu Guangwu, Wang Shijin et al.. The solar X-EUV imaging telescope［J］. Chinese J. Geophysics, 2005, 48(2): 235～242

[3] [3] Kuang Yuguang. Optical design of X-ray imaging telescope［J］. Acta Optica Sinica, 1981, 1(3): 239～246

[4] [4] James E. Harvey, Andrey Krywonos, Patrick L. Thompson et al.. Grazing-incidence hyperboloid-hyperboloid designs for wide-field X-ray imaging applications［J］. Appl. Opt., 2001, 40(1): 136～144

[5] [5] Timo T. Saha, William Zhang. Equal-curvature grazing-incidence X-ray telescopes［J］. Appl. Opt., 2003, 42(22): 4599～4605

[6] [6] Li Shun, Gong Yan. Design of grazing incidence optical system ［J］. Acta Optica Sinica, 2009, 29(8): 2276～2281

[7] [7] Patrick L. Thompson, James E. Harvey. Systems engineering analysis of aplanatic Wolter type I X-ray telescopes［J］. Opt. Engng., 2000, 39(6): 1677～1691

[8] [8] Shinan Qian, Haizhang Li, Peter Z. Takacs. Penta-prism long trace profiler (PPLTP) for measurement of grazing incidence space optics［C］. SPIE, 1996, 2805: 108～114

[9] [9] Haizhang Li, Xiaodan Li, Manfred W. Grindel et al.. Measurement of X-ray telescope mirrors using a vertical scanning long trace profiler［J］. Opt. Engng., 1996, 35(2): 330～338

[10] [10] Peter Z. Takacs, Shinan. Qian, J. Colbert. Design of a long-trace surface profiler［C］. SPIE, 1987, 749: 59～64

[11] [11] Yang Zhao, Zhi Li, Dacheng Li et al.. Principle of π-phase plate long trace profiler for synchrotron radiation optics［J］. Opt. Commun., 2001, 200(1-6): 23～26

[12] [12] Li Zhi, Zhao Yang, Li Dacheng et al.. A diffractive long trace profiler for large aspherical optics ［J］. Acta Optica Sinica, 2002, 22(10): 1224～1228

[13] [13] Shinan Qian, Peter Z. Takacs. Equal optical path beamspliter for a pencil beam interferometer and shearing interferometer［J］. Opt. Engng., 2003, 42(4): 929～934

[14] [14] Shinan Qian, Peter Z. Takacs. Design of multiple-function long trace profiler［J］. Opt. Engng., 2007, 46(4): 043602

[15] [15] Haizhang Li, Peter Z. Takacs, Tom Oversluizen. Vertical scanning long trace profiler: a tool for metrology of X-ray mirrors［C］. SPIE, 1997, 3152: 180～187

[16] [16] Li Shun, Gong Yan, Zhang Wei et al.. Design of co-path scanning long trace profiler for measurement of X-ray space optical elements［C］. SPIE, 2010, 7544: 754421

[17] [17] Cui Tiangang, Wang Yonggang, Ma Dongmei et al.. Design of online measuring device for surface profile of Wolter type I mirror ［J］. Opt. & Precision Engng., 2010, 18(8): 1801～1806

[18] [18] Cui Tiangang, Zhang Hongji, Ma Dongmei et al.. Improvements of surface profile measuring device for Wolter type-I mirror ［J］. Acta Optica Sinica, 2011, 31(4): 0412007

[19] [19] Shinan Qian, Giovanni Sostero, Peter Z. Takacs. Precision calibration and systematic error reduction in the long trace profiler ［J］. Opt. Engng., 2000, 39(1): 304～310

[20] [20] Peter Z. Takacs, Eugene L. Church, Cynthia J. Bresloff et al.. Improvements in the accuracy and the repeatability of long trace profiler measurements［J］. Appl. Opt., 1999, 38(25): 5468～5479

[21] [21] Peter Z. Takacs. Cylinder lens alignment in the LTP［C］. SPIE, 2005, 5921: 592105

[22] [22] Valeriy V. Yashchuk, Steve C. Irick, Alastair A. MacDowell et al.. Air convection noise of pencil-beam interferometer for long trace profiler［C］. SPIE, 2006, 6317: 63170D

[23] [23] Eric Marsh, Jeremiah Couey, Ryan Vallance. Nanometer-level comparison of three spindle error motion separation techniques［J］. ASME J. Manuf. Sci. Engng., 2006, 128(1): 180～187