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Laser & Optoelectronics Progress, Volume. 51, Issue 1, 11202(2014)

Research on Sub-Aperture Stitching Testing Technology Based on Iterative Gradient Algorithm

Zheng Ligong1、*, Yan Lisong1,2, Wang Xiaokun1, Xue Donglin1, Hu Haixiang1,2, and Zhang Xuejun1
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    Article index updated: Mar. 15, 2025

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    Zheng Ligong, Yan Lisong, Wang Xiaokun, Xue Donglin, Hu Haixiang, Zhang Xuejun. Research on Sub-Aperture Stitching Testing Technology Based on Iterative Gradient Algorithm[J]. Laser & Optoelectronics Progress, 2014, 51(1): 11202

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 9, 2013

    Accepted: --

    Published Online: Jan. 3, 2014

    The Author Email: Ligong Zheng (ligongz@yahoo.com)

    DOI:10.3788/lop51.011202

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology