[1] J B Richard, A Andrew, S Liubov. Design of the mirror optical systems for coherent diffractive imaging at the SPB/SFX instrument of the European XFEL. Journal of Optics, 18, 074011(2016).

[2] [2] Takacs P Z, Qian S, Colber J, et al. Design of a long trace surface profiler[C]SPIE, 1987, 0749: 59−64.

[3] S Qian, W Jark, P Z Takacs. The penta‐prism LTP: A long‐trace‐profiler with stationary optical head and moving penta prism. Review of Scientific Instruments, 66, 2562-2569(1995).

[4] P Z Takacs, E L Church, C J Bresloff. Improvements in the accuracy and the repeatability of long trace profiler measurements. Appl. Opt., 38, 5468-5479(1999).

[5] [5] Siewert F, Noll T, Schlegel T, et al. The nanometer optical component measuring machine: a new sub‐nm topography measuring device f X‐ray optics at BESSY[C]AIP Conference Proceedings, 2004, 705: 847−850.

[6] [6] Nicolas J, Pedreira P, Šics I, et al. Nanometer accuracy with continuous scans at the ALBANOM[C]SPIE, 2016, 9962: 996203.

[7] [7] Qian S, Idir M. Innovative nanoaccuracy surface profiler f sub50 nrad rms mirr test[C] SPIE, 2016, 9687: 96870D.

[8] Shinan Qian. Nanometer and nanoradian accuracy measurement of large scale plane and asphere——principle, applications and development of long trace profiler. Laser & Optoelectronics Progress, 45, 16-25(2008).

[9] de Groot P. Principles of interference microscopy for the measurement of surface topography. Adv Opt Photon, 7, 1-65(2015).

[10] Xi Hou, Fan Wu, Li Yang. Status and development trend of sub-aperture stitching interferometric testing technique. Optics & Optoelectronic Technology, 3, 50-53(2005).

[11] Lingyan Ding, Yifan Dai, Shanyong Chen. Experiments of sub-aperture stitching interferometry for flat mirrors. Optics and Precision Engineering, 16, 978-985. (in Chinese)(2008).

[12] Dingxiao Liu, Weifan Sheng, Qiushi Wang. Current status and trends of stitching interferometry in synchrotron radiation field. Optics and Precision Engineering, 24, 2357-2369(2016).

[13] K Yamauchi, K Yamamura, H Mimura. Microstitching interferometry for x-ray reflective optics. Review of Scientific Instruments, 74, 2894-2898(2003).

[14] H Mimura, H Yumoto, S Matsuyama. Relative angle determinable stitching interferometry for hard x-ray reflective optics. Review of Scientific Instruments, 76, 045102(2005).

[15] [15] Ohashi H, Tsumura T, Okada H, et al. Microstitching interferometer relative angle determinable stitching interferometer f halfmeterlong xray mirr[C]SPIE, 2007, 6704: 670401.

[16] H Yumoto, H Mimura, T Kimura. Stitching interferometric metrology for steeply curved x-ray mirrors. Surface and Interface Analysis, 40, 1023-1027(2008).

[17] H Yumoto, H Mimura, S Hand. Stitching-angle measurable microscopic-interferometer: Surface-figure metrology tool for hard X-ray nanofocusing mirrors with large curvature. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 616, 203-206(2010).

[18] A Vivo, B Lantelme, R Baker. Stitching methods at the European Synchrotron Radiation Facility (ESRF). Review of Scientific Instruments, 87, 051908(2016).

[19] L Huang, J Xue, B Gao. One-dimensional angular-measurement-based stitching interferometry. Opt Express, 26, 9882-9892(2018).

[20] J Nicolas, P Pedreira, J Campos. Completeness condition for unambiguous profile reconstruction by sub-aperture stitching. Opt Express, 26, 27212-27220(2018).

[21] A Vivo, R Barrett, F Perrin. Stitching techniques for measuring X-ray synchrotron mirror topography. Review of Scientific Instruments, 90, 021710(2019).

[22] F Polack, M Thomasset, S Brochet. Surface shape determination with a stitching Michelson interferometer and accuracy evaluation. Review of Scientific Instruments, 90, 021708(2019).

[23] L Huang, T Wang, K Tayabaly. Stitching interferometry for synchrotron mirror metrology at National Synchrotron Light Source II (NSLS-II). Optics and Lasers in Engineering, 124, 105795(2020).

[24] M Otsubo, K Okada, J Tsujiuchi. Measurement of large plane surface shapes by connecting small-aperture interferograms. Optical Engineering, 33, 608-613(1994).

[25] [25] Bray M. Stitching interferometry: how why it wks[C] SPIE, 1999, 3739: 259273.

[26] J Xue, L Huang, B Gao. One-dimensional stitching interferometry assisted by a triple-beam interferometer. Opt Express, 25, 9393-9405(2017).

[27] L Huang, T Wang, J Nicolas. Two-dimensional stitching interferometry for self-calibration of high-order additive systematic errors. Opt Express, 27, 26940-26956(2019).