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Acta Optica Sinica, Volume. 43, Issue 11, 1112002(2023)

Measurement of Reflected Light Field of Rough Surfaces Using Ultrawide-angle Imaging

Zongtao Duan1, Jian Zhang1,2,3、*, Guoyu Zhang1,2,3, Yangyang Zou4, Zhengjie Niu1, Bin Zhao1, Xiaoxu Mo1, Zhikun Yun1, Jianliang Zhang5, and Jia Guo6
Author Affiliations
  • 1School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun 130022, Jilin, China
  • 2Jilin Photoelectric Measurement and Control Instrument Engineering Technology Research Center, Changchun 130022, Jilin, China
  • 3Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology, Ministry of Education, Changchun 130022, Jilin, China
  • 4College of Instrumentation & Electrical Engineering, Jilin University, Changchun 130012, Jilin, China
  • 5Air Force Aviation University, Changchun 130022, Jilin, China
  • 6Changchun Wanyi Technology Application Co., Ltd., Changchun 130022, Jilin, China
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    Article index updated: Mar. 10, 2025

    The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)
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    Zongtao Duan, Jian Zhang, Guoyu Zhang, Yangyang Zou, Zhengjie Niu, Bin Zhao, Xiaoxu Mo, Zhikun Yun, Jianliang Zhang, Jia Guo. Measurement of Reflected Light Field of Rough Surfaces Using Ultrawide-angle Imaging[J]. Acta Optica Sinica, 2023, 43(11): 1112002

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 29, 2022

    Accepted: Feb. 7, 2023

    Published Online: May. 29, 2023

    The Author Email: Zhang Jian (zhangjian_nr@126.com)

    DOI:10.3788/AOS222179

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology