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Laser & Optoelectronics Progress, Volume. 59, Issue 21, 2134001(2022)

Prediction Model of Aluminized Layer Thickness Based on X-Ray Fluorescence and Extreme Gradient Boosting

Zhuoyue Li, Cheng Wang*, Qiuliang Li, Zhenping Guo, Bin Li, and Xin Li
Author Affiliations
  • Fundamentals Department, Air Force Engineering University, Xi'an 710051, Shaanxi , China
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    Article index updated: Sep. 7, 2025

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    Zhuoyue Li, Cheng Wang, Qiuliang Li, Zhenping Guo, Bin Li, Xin Li. Prediction Model of Aluminized Layer Thickness Based on X-Ray Fluorescence and Extreme Gradient Boosting[J]. Laser & Optoelectronics Progress, 2022, 59(21): 2134001

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    Paper Information

    Category: X-Ray Optics

    Received: Sep. 15, 2021

    Accepted: Oct. 26, 2021

    Published Online: Oct. 31, 2022

    The Author Email: Cheng Wang (valid_01@163.com)

    DOI:10.3788/LOP202259.2134001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology