Metrology & Measurement Technology, Volume. 45, Issue 1, 80(2025)

Fabrication and performance study of thin⁃film strain gauges for strain test of high⁃temperature C / SiC composites

Yujie ZHANG, Weiqing PEI, Yijie TANG, and Hongchuan JIANG
Author Affiliations
  • State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu611731, China
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    Figures & Tables(11)
    Thin film strain gauge structure
    Picture of strain gauge fabricated on C / SiC substrate
    Schematic diagram of cantilever beam principle
    XRD test results of three composite insulation layers after high temperature cycling
    SEM images of YSZ / Al2O3, Al2O3⁃YSZ / Al2O3 and HfO2⁃YSZ / Al2O3 composite insulating layer films after 3 heating and cooling cycles
    EDS surface scanning element distribution map of HfO2⁃YSZ / Al2O3 composite insulation layer film after 3 heating and cooling cycles
    Temperature⁃resistance curve of YSZ / Al2O3 insulation layer
    Temperature⁃resistance curve of Al2O3⁃YSZ / Al2O3 insulation layer
    Temperature⁃resistance curve of HfO2⁃YSZ / Al2O3 insulation layer
    Strain⁃resistance curves of thin film strain gauges at different temperatures
    • Table 1. Fabrication parameters of each layer of thin film strain gauge

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      Table 1. Fabrication parameters of each layer of thin film strain gauge

      材料制备方式靶材或源气氛环境气压 / Pa功率 / W厚度 / nm制备温度
      YSZ / Al₂O₃直流溅射Y₀.₀₈Zr₀.₉₂ + AlO2 + Ar0.41001 100室温
      Al₂O₃ALD三甲基铝20119150 ℃
      HfO₂ALD四(二甲胺)铪27106200 ℃
      Pt直流溅射PtAr0.4120450室温
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    Yujie ZHANG, Weiqing PEI, Yijie TANG, Hongchuan JIANG. Fabrication and performance study of thin⁃film strain gauges for strain test of high⁃temperature C / SiC composites[J]. Metrology & Measurement Technology, 2025, 45(1): 80

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    Paper Information

    Category: Theory and Method

    Received: Jan. 3, 2025

    Accepted: --

    Published Online: Jul. 23, 2025

    The Author Email:

    DOI:10.11823/j.issn.1674-5795.2025.01.05

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