Chinese Journal of Lasers, Volume. 52, Issue 11, 1104006(2025)

Research on Extreme Ultraviolet Radiation Detection System and Its Calibration Techniques

Shouyi Li1,2, Nan Nan1、**, Jianrong Yang1,2, and Zhongliang Li1,2、*
Author Affiliations
  • 1Department of Advanced Optical and Microelectronic Equipment, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(14)
    EUV detection diagram
    Reflectance of planar multilayer mirrors for different polarized light at different incidence angles
    EUV spectral curves formed under different laser power densities
    Spectral energy distributions on detector obtained by systems with 1-3 multilayer mirrors when light source signal with power density of 1.00×1011 W/cm2 is illuminated
    Spectral response curve of SXUV100 photodiode [23]
    Performance of pulse signals measured by SXUV100 photodiode. (a) Single pulse energy and signal pulse width detected by SXUV100 photodiode versus input single pulse energy of 532 nm light source ; (b) response time of detection signal of SXUV100 photodiode versus input single pulse energy of 532 nm light source
    System design and setup. (a) System structure diagram; (b) physical drawing of EUV radiation detection system
    Calibration of EUV radiation detection system using metrology beamline at Hefei National Synchrotron Radiation Laboratory
    Spectral response curve of EUV radiation detector system
    Transmittance curve of Zr filter film
    Calibration curve of complete system and theoretical curve calculated from nominal parameters of each component
    Spectral energy distribution detected by detector
    • Table 1. Impact analysis of different combination systems on EUV spectral curves under laser irradiations with different power densities

      View table

      Table 1. Impact analysis of different combination systems on EUV spectral curves under laser irradiations with different power densities

      Combination system

      Laser power density /

      (W/cm2

      Reference calibration

      factor /(A/W)

      Deviation between calculated

      and actual values / %

      In-band energy

      fraction /%

      System with 1 multilayer mirror

      (system bandwidth of 3.92%)

      Φ =8.60×1010

      0.0542

      -5.8149.42
      Φ =1.00×1011046.50
      Φ =1.90×10116.7843.51

      System with 2 multilayer mirrors

      (system bandwidth of 3.26%)

      Φ =8.60×1010

      0.0284

      -3.1561.89
      Φ =1.00×1011059.78
      Φ =1.90×10113.2657.78

      System with 3 multilayer mirrors

      (system bandwidth of 2.81%)

      Φ =8.60×1010

      0.0171

      -2.1268.27
      Φ =1.00×1011066.54
      Φ =1.90×10112.1664.95
    • Table 2. Uncertainty analysis of EUV radiation detection system

      View table

      Table 2. Uncertainty analysis of EUV radiation detection system

      VariableMeasured valueUncertainty /%Degree of freedom
      S0.0393 A/W @13.5 nm1.436
      I0.15@13.5 nm1.223
      SPTB0.2682 A/W @13.5 nm0.7450
      T0.37 @13.5 nm1.183
      Qpluse0.1‒100 nV·s1.1550
      Rscope50 Ω0.0150
      Ω3.53×10-5 sr0.8750
      D2.00 mm0.8750
      L596.6 mm0.0150
      Total uncertainty2.3%
      Expanded uncertainty4.8%
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    Shouyi Li, Nan Nan, Jianrong Yang, Zhongliang Li. Research on Extreme Ultraviolet Radiation Detection System and Its Calibration Techniques[J]. Chinese Journal of Lasers, 2025, 52(11): 1104006

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    Paper Information

    Category: Measurement and metrology

    Received: Jan. 2, 2025

    Accepted: Mar. 3, 2025

    Published Online: Jun. 14, 2025

    The Author Email: Nan Nan (nannan@siom.ac.cn), Zhongliang Li (lizhongliang@siom.ac.cn)

    DOI:10.3788/CJL250428

    CSTR:32183.14.CJL250428

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