Laser & Optoelectronics Progress, Volume. 62, Issue 15, 1511002(2025)

Fast Background Removal for Wide-Field Microscopic Imaging Defocus Signal (Invited)

Xinghao Li, Qianbo Liu, Yizhe Hao, Hao Xu, Wenhao Liu**, and Weisong Zhao*
Author Affiliations
  • School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin 150080, Heilongjiang , China
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    Figures & Tables(4)
    Simulation of PSF and convolution schematic diagrams in wide-field fluorescent microscopy. (a) 3D rendering of the PSF; (b) cross-sectional views of the PSF; (c) simulated five rings at different depths; (d) depth-color-coded images of five rings; (e) WF image taken by microscope focused on the ring in the middle layer; (f) 3D stack obtained by scanning the five rings layer by layer; (g) depth-color-coded maximum projection of the 3D stack on x-y plane
    Background-removal flowchart. (a) Computational flowchart; (b) schematic diagram of reconstruction process
    Simulated results of line-shaped samples by proposed algorithm. (a1) Sample ground truth (GT) profiles; (a2) samples convolved with the PSF; (a3) processed results of WF images by proposed algorithm (deconv 1); (a4) WF images added Gaussian noise; (a5) processed results of WF images with Gaussian noise by proposed algorithm (deconv 2); intensity profiles of line pair with space of (b1) 90 nm, (b2) 120 nm, (b3) 150 nm, and (b4) 180 nm
    BPAE cell images and intensity results. (a) Depth-color-coded maximum projection of the 3D stack before and after treated by proposed algorithm; enlarged views of the lower-left region in Fig. 4(a), with a single-frame depth of 1.3 μm (b) after processing and (c) before processing; enlarged views of the upper-right region in Fig. 4(a), with a single-frame depth of 1.3 μm (d) after processing and (e) before processing; (f) intensity results along the selected line regions in the enlarged images
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    Xinghao Li, Qianbo Liu, Yizhe Hao, Hao Xu, Wenhao Liu, Weisong Zhao. Fast Background Removal for Wide-Field Microscopic Imaging Defocus Signal (Invited)[J]. Laser & Optoelectronics Progress, 2025, 62(15): 1511002

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    Paper Information

    Category: Imaging Systems

    Received: Apr. 22, 2025

    Accepted: Jun. 3, 2025

    Published Online: Jul. 4, 2025

    The Author Email: Wenhao Liu (wenhaoliu@hit.edu.cn), Weisong Zhao (weisongzhao@hit.edu.cn)

    DOI:10.3788/LOP251069

    CSTR:32186.14.LOP251069

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