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Chinese Journal of Lasers, Volume. 26, Issue 4, 372(1999)

Transmission Electron Microscopy for Microstructural Characterization of the Laser Clad Ni-Cr-B-Si-C Alloy

[in Chinese]1,2, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]3, and [in Chinese]1
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Transmission Electron Microscopy for Microstructural Characterization of the Laser Clad Ni-Cr-B-Si-C Alloy[J]. Chinese Journal of Lasers, 1999, 26(4): 372

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    Paper Information

    Category: laser manufacturing

    Received: Nov. 25, 1997

    Accepted: --

    Published Online: Aug. 9, 2006

    The Author Email:

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology