Fig. 1. Simulated impacts from different types of microscopic fragments: (a) penetration holes, (b) compression-induced cracking and (c) cratering.

Fig. 2. Damage condition of high-reflectance thin film (one series) and substrate (two series) samples: (a) initial damage morphology; (b) damage to the membrane around the hole; (c) bright spots appearing around the hole; (d) extensive damage centered around the hole.

Fig. 3. LIDT results for different states in 30 μm substrates and high-reflection films (1, initial damage morphology; 2, damage to the membrane around the hole; 3, bright spots appearing around the hole; 4, extensive damage centered around the hole).

Fig. 4. A comparison of LIDTs for high-reflection films under the action of single space environmental factors (‘Without’ represents being without any space environmental factors).

Fig. 5. A comparison of LIDTs for substrates under the action of single space environmental factors (‘Without’ represents being without any space environmental factors).

Fig. 6. A comparison of LIDT values produced by the coupled effect of atomic oxygen and protons.

Fig. 7. A comparison of LIDT values for simulated fragment compressions in (a) high-reflectance films and (b) substrates. A, protons and atomic oxygen; B, protons and penetration; C, atomic oxygen and penetration; D, protons and atomic oxygen and penetration.

Fig. 8. Surface morphology images of three-band high-reflectance thin films before and after proton and atomic oxygen irradiation: (a) before proton irradiation; (b) after proton irradiation; (c) before atomic oxygen irradiation; (d) after atomic oxygen irradiation.

Fig. 9. SRIM simulations of proton concentrations and atomic oxygen distributions within the membrane layer: (a) protons; (b) atomic oxygen.