Polarization Suppression Reflection Method Based on Mueller Matrix

Jialin Wang; Jin Duan; Qiang Fu; Guofang Xie; Suxin Mo; Ruisen Fang

doi:10.3788/AOS230572

Acta Optica Sinica, Volume. 43, Issue 20, 2012003(2023)

Polarization Suppression Reflection Method Based on Mueller Matrix

Jialin Wang¹, Jin Duan^1、*, Qiang Fu², Guofang Xie¹, Suxin Mo¹, and Ruisen Fang¹

¹College of Electronic Information Engineering, Changchun University of Science and Technology, Changchun 130022, Jilin, China

²National Defense Key Laboratory of Air-Ground Laser Communication Technology, Changchun University of Science and Technology, Changchun 130022, Jilin, China

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Figures & Tables(16)

Fig. 1. Target through-window imaging model

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Fig. 2. Simulation image of reflectance and transmittance variation law^[2]

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Fig. 3. Simulation image of reflected light and transmitted light polarization degree variation law

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Fig. 4. Flow diagram of Mueller matrix test experiment

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Fig. 5. Mueller matrix test experimental setup

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Fig. 6. Single polarization suppression of reflection. (a) Target source image; (b) overexposed image; (c) $P 2 = 0^{o}$ ; (d) $P 2 = 45^{o}$ ; (e) $P 2 = 90^{o}$ ; (f) $P 2 = 135^{o}$

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Fig. 7. Double polarization orthogonal suppression of reflection under different incident angles of light source. (a) 20°; (b) 30°; (c) 40°; (d) 50°

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Fig. 8. Image index comparison results. (a) Contrast between target and background; (b) overall image light intensity

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Fig. 9. Mueller matrix images under different incident angles of light source. (a) 20°; (b) 30°; (c) 40°; (d) 50°

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Fig. 10. Gray Mueller matrix images and their histograms under different incident angles of light source. (a) 20°; (b) 30°; (c) 40°; (d) 50°

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Fig. 11. Differences in images of different elements of Mueller matrix under different incident angles of light source

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Fig. 12. Depolarization images under different incident angles of light source. (a) 20°; (b) 30°; (c) 40°; (d) 50°

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Table 1. Phase shift law of S and P polarization component reflected lights
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Table 1. Phase shift law of S and P polarization component reflected lights
Polarization component $0^{o} < θ < θ_{B}$ $θ = θ_{B}$ $θ_{B} < θ < 90^{o}$ $θ = 0^{o}$ or $θ = 90^{o}$
P 0 uncertainty $π$ Half-wave loss
S $π$ $π$ $π$ Half-wave loss

Table 2. Mueller matrix elements of different materials
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Table 2. Mueller matrix elements of different materials
Material M₁₁ M₂₂ M₃₃
Tennis 0.936 0.022 0.009
Grass 0.736 0.079 0.069
Background 0.968 0.781 0.587

Table 3. Comparison of target and background indices in depolarization images
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Table 3. Comparison of target and background indices in depolarization images
Incident angle Tennis Grass Background
Intensity Contrast Intensity Contrast Intensity
20° 0.952 0.574 0.875 0.544 0.256
30° 0.972 0.523 0.907 0.499 0.303
40° 0.977 0.364 0.954 0.354 0.455
50° 0.966 0.491 0.894 0.458 0.331

Table 4. Comparison of target through-window detection image indices

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Table 4. Comparison of target through-window detection image indices

Polarization suppression reflection method	Specific implementation	Intensity	Contrast
Overexposed image	No P2	241.951	0.033
Method 1	$P 2 = 0^{o}$	213.201	0.086
	$P 2 = 45^{o}$	204.207	0.106
	$P 2 = 90^{o}$	178.913	0.147
	$P 2 = 135^{o}$	198.357	0.121
Method 2	$P 1 = 0^{o}, P 2 = 90^{o}$	30.222	0.653
	$P 1 = 45^{o}, P 2 = 135^{o}$	38.114	0.452
	$P 1 = 90^{o}, P 2 = 0^{o}$	33.861	0.445
	$P 1 = 135^{o}, P 2 = 45^{o}$	46.663	0.524
Depolarization image	—	154.709	0.481

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Jialin Wang, Jin Duan, Qiang Fu, Guofang Xie, Suxin Mo, Ruisen Fang. Polarization Suppression Reflection Method Based on Mueller Matrix[J]. Acta Optica Sinica, 2023, 43(20): 2012003

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