Laser & Optoelectronics Progress, Volume. 58, Issue 10, 1011027(2021)
Correction Method for Spatial Frequency Domain Imaging Based on Target Profile Measurement
Fig. 2. SPI-SFD imaging system based on high sensitivity lock-in photon counting detection technology. (a) Schematic diagram of the imaging system; (b) projection direction of the sinusoidal fringe; (c) sampling template
Fig. 3. Measurement results of the phantom profile of different height plates. (a) 3D reconstruction result of the modified height-phase function; (b) heights of the phantom surface reconstructed by different functions
Fig. 4. Profile measurement results of the hemisphere phantom. (a) Reconstruction heights under different sampling radius; (b) three-dimensional profile reconstruction results when r=6
Fig. 5. Measurement results of the optical characteristics of the double hemisphere phantom. (a) Absorption coefficient and reduced scattering coefficient before and after correction; (b) profile of the absorption coefficient; (c) profile of the reduced scattering coefficient
Fig. 6. Measurement results of the optical characteristics of the palm. (a) Collection area; (b) three-dimensional topography; (c) optical characteristics at different wavelengths before and after correction
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Meihui Liu, Mai Dan, Feng Gao. Correction Method for Spatial Frequency Domain Imaging Based on Target Profile Measurement[J]. Laser & Optoelectronics Progress, 2021, 58(10): 1011027
Category: Imaging Systems
Received: Jan. 25, 2021
Accepted: Mar. 29, 2021
Published Online: May. 28, 2021
The Author Email: Feng Gao (gaofeng@tju.edu.cn)