Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Journal of Infrared and Millimeter Waves, Volume. 25, Issue 1, 13(2006)

EFFECT OF OVERSAMPLE-SUPERPOSITON ON MTF FOR LONG WAVE INFRARED CAMERA LI Pi-Ding LI Yu-Min FU Yu-Tian GONG Hui-Xing

[in Chinese]1,2, [in Chinese]1, [in Chinese]1, and [in Chinese]1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
    • show less
    AbstractGet PDF
    Figures&Tables (0)
    Equations (0)
    References (2)
    Tools
    Paper Information
    Topics
    References(2)

    [2] [2] Richard H.vollemerhausen.Analysis of Sampled Imaging Systems [ M ],Belingham Washington:SPIE PRESS.2002.

    [5] [5] Glenn D.Borman.Modulation Transfer Function in Optical and Electro-Optical System [ M ],Belingham Washington:SPIE Press.2002.

    CLP Journals

    [1] Zhang Lisha, Liu Zhaojun, Ma Wenpo, Long Liang, Wu Limin. Infrared Imaging Technology Based on Pixel-Level Digital Integration[J]. Laser & Optoelectronics Progress, 2016, 53(9): 91102

    [2] Li Lin, Yao Suying, Xu Jiangtao, He Chunliang. Research on Modulation Transfer Function Model of TDI-CMOS Image Sensor with Oversample-Superposition[J]. Acta Optica Sinica, 2014, 34(2): 228002

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. EFFECT OF OVERSAMPLE-SUPERPOSITON ON MTF FOR LONG WAVE INFRARED CAMERA LI Pi-Ding LI Yu-Min FU Yu-Tian GONG Hui-Xing[J]. Journal of Infrared and Millimeter Waves, 2006, 25(1): 13

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Received: Apr. 26, 2005

    Accepted: --

    Published Online: Jul. 5, 2006

    The Author Email:

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology