Rapid determination method of minimum stable topological plate thickness in topology optimization of complex hull structures

Junxia ZHU; Jiameng WU; Yachong LIU; Mingxing GAO

doi:10.19693/j.issn.1673-3185.02055

Chinese Journal of Ship Research, Volume. 16, Issue 6, 159(2021)

Rapid determination method of minimum stable topological plate thickness in topology optimization of complex hull structures

Junxia ZHU^1,2, Jiameng WU^1,2, Yachong LIU^1,2, and Mingxing GAO¹

Author Affiliations

¹Marine Design and Research Institute of China, Shanghai 200011, China

²Shanghai Key Laboratory of Ship Engineering, Shanghai 200011, China

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References(5)

[3] BENDSØE M P, SIGMUND O. Material interpolation schemes in topology optimization[J]. Archive of Applied Mechanics, 69, 635-654(1999).

[4] [4] BENDSOE M P, SIGMUND O. Topology optimization: they, methods applications[M]. Berlin: Springer, 2003.

[5] [5] QIU W Q, GAO C, SUN L, et al. Research on topology optimization method f tanker structures in cargo tank region[C]TSCF 2016 Shipbuilders Meeting. Shanghai, China: Marine Design & Research Institute of China, 2016.

[8] [8] ZHU J X, WU J M. Research on topology optimization of transverse web frame in ship cargo hold region of VLCC based on variable density method[C]The 30th International Ocean Polar Engineering Conference. Virtual: ISOPE, 2020.

[10] [10] IACS. Common structural rules f bulk carriers oil tanker[S]. [S.1.]: International Association of Classification Society, 2017.

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Junxia ZHU, Jiameng WU, Yachong LIU, Mingxing GAO. Rapid determination method of minimum stable topological plate thickness in topology optimization of complex hull structures[J]. Chinese Journal of Ship Research, 2021, 16(6): 159

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Paper Information

Category: Ship Structure and Fittings

Received: Aug. 2, 2020

Accepted: --

Published Online: Mar. 28, 2025

The Author Email:

DOI:10.19693/j.issn.1673-3185.02055

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology