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High Power Laser Science and Engineering, Volume. 10, Issue 6, 06000e42(2022)

Multilayer dielectric grating pillar-removal damage induced by a picosecond laser

Kun Shuai1,2, Xiaofeng Liu2, Yuanan Zhao2、*, Keqiang Qiu3, Dawei Li2, He Gong4, Jian Sun2, Li Zhou5, Youen Jiang5, Yaping Dai6, Jianda Shao2,7, and Zhilin Xia1
Author Affiliations
  • 1School of Materials Science and Engineering, Wuhan University of Technology, Wuhan, China
  • 2Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics, Shanghai, China
  • 3National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, China
  • 4School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai, China
  • 5National Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai, China
  • 6Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, China
  • 7Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, China
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    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 11 article(s) from Web of Science.
    The article is cited by 4 article(s) CLP online library. (Some content might be in Chinese.)
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    Kun Shuai, Xiaofeng Liu, Yuanan Zhao, Keqiang Qiu, Dawei Li, He Gong, Jian Sun, Li Zhou, Youen Jiang, Yaping Dai, Jianda Shao, Zhilin Xia. Multilayer dielectric grating pillar-removal damage induced by a picosecond laser[J]. High Power Laser Science and Engineering, 2022, 10(6): 06000e42

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    Paper Information

    Category: Research Articles

    Received: Sep. 3, 2022

    Accepted: Oct. 27, 2022

    Posted: Oct. 28, 2022

    Published Online: Dec. 23, 2022

    The Author Email:

    DOI:10.1017/hpl.2022.34

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology