Photonics Research, Volume. 8, Issue 10, 1613(2020)
Design and analysis of extended depth of focus metalenses for achromatic computational imaging
Fig. 1. EDOF metasurface design and measurements. (A) The phase masks of an ordinary metalens and four different EDOF metasurfaces. (B) Scanning electron micrographs of the fabricated metasurfaces. Inset shows the pillar distribution. (C) We experimentally measured the intensity along the optical axis where panels from top to bottom represent illumination by 625 nm, 530 nm, and 455 nm wavelengths. A cross section on the
Fig. 2. Characterization of the metasurfaces. The PSFs of the singlet metasurfaces were measured under (A) 455 nm blue, (B) 530 nm green, and (C) 625 nm red. The corresponding
Fig. 3. Simulated imaging performance after deconvolution. Deconvolved images captured by the EDOF imaging system, using the simulated images and PSFs. The experimental counterpart can be found in Fig.
Fig. 4. Imaging performance. Restored images taken from (A) an OLED display of colored letters in ROYGBVWG, (B) a colorful neighborhood, and (C) vibrant umbrellas against the sky. The scale bar signifies 20 μm. Note that the metalens images are raw and unrestored.
Fig. 5. Full color SSIM. The restored captures are scaled, rotated, and translated to align with the ground truth; then SSIM is calculated for each color channel for the metasurface.
Fig. 6. Phase (dashed lines) and amplitude (solid lines) response of the nanopillars, simulated using RCWA.
Fig. 7. Simulated captured images before deconvolution. The experimental counterpart is shown in Fig.
Fig. 8. SSIM values when different regularization parameters are utilized.
Fig. 9. Raw images taken from an OLED display of colored letters in (A) ROYGBVWG, (B) a colorful neighborhood, and (C) vibrant umbrellas against the sky.
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Luocheng Huang, James Whitehead, Shane Colburn, Arka Majumdar, "Design and analysis of extended depth of focus metalenses for achromatic computational imaging," Photonics Res. 8, 1613 (2020)
Category: Imaging Systems, Microscopy, and Displays
Received: May. 5, 2020
Accepted: Aug. 17, 2020
Published Online: Sep. 27, 2020
The Author Email: Arka Majumdar (arka@uw.edu)