Chinese Optics Letters, Volume. 2, Issue 5, 05308(2004)

Study for infrared spectroscopic ellipsometric properties of diamond films

Linjun Wang1,2、*, Yiben Xia1,2, Hujiang Shen1,2, Minglong Zhang1,2, Ying Yang1,2, and Lin Wang1,2
Author Affiliations
  • 1School of Materials Science &
  • 2Engineering, Shanghai University, Shanghai 201800
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    References(9)

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    CLP Journals

    [1] Yuan Zhao, Mingyu Sheng, Yuxiang Zheng, Liangyao Chen, "Accurate analysis of ellipsometric data for thick transparent f ilms," Chin. Opt. Lett. 9, 053101 (2011)

    [2] [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Advance of Optical Chemical Vapor Deposition Diamond Thin Films[J]. Laser & Optoelectronics Progress, 2006, 43(7): 22

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    Linjun Wang, Yiben Xia, Hujiang Shen, Minglong Zhang, Ying Yang, Lin Wang, "Study for infrared spectroscopic ellipsometric properties of diamond films," Chin. Opt. Lett. 2, 05308 (2004)

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    Paper Information

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    Received: Sep. 23, 2003

    Accepted: --

    Published Online: Jun. 6, 2006

    The Author Email: Linjun Wang (ljwang@mail.shu.edu.cn)

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