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Infrared Technology, Volume. 42, Issue 10, 1001(2020)

Defect Detection of Eddy-Current Thermography Based on Single-Scale Retinex and Improved K-means Clustering

Qingyu ZHANG1,2、*, Yugang FAN1,2, and Yang GAO1,2
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    ZHANG Qingyu, FAN Yugang, GAO Yang. Defect Detection of Eddy-Current Thermography Based on Single-Scale Retinex and Improved K-means Clustering[J]. Infrared Technology, 2020, 42(10): 1001

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    Paper Information

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    Received: Jul. 15, 2019

    Accepted: --

    Published Online: Nov. 25, 2020

    The Author Email: Qingyu ZHANG (280208691@qq.com)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology