Electronics Optics & Control, Volume. 32, Issue 2, 93(2025)

On Complex Airborne Electronic System Failure Probability Caculation with Common Cause Failure Consideration

SUN Zijing, LIU Wen, LIU Yuan, and WU Yuting
Author Affiliations
  • Aeronautics Computing Technique Research Institute, AVIC, Xi'an 710000, China
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    SUN Zijing, LIU Wen, LIU Yuan, WU Yuting. On Complex Airborne Electronic System Failure Probability Caculation with Common Cause Failure Consideration[J]. Electronics Optics & Control, 2025, 32(2): 93

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Dec. 19, 2023

    Accepted: Feb. 20, 2025

    Published Online: Feb. 20, 2025

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2025.02.015

    Topics