Journal of Semiconductors, Volume. 46, Issue 8, 082502(2025)

Effect of grain size on the resistivity of polycrystalline 3C-SiC

Guo Li, Lei Ge*, Mingsheng Xu, Jisheng Han, and Xiangang Xu
Author Affiliations
  • Institute of Novel Semiconductor Materials and State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China
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    Figures & Tables(7)
    (Color online) EBSD results of (a) unintentionally doped and (b) nitrogen doped samples.
    (Color online) (a) The relationship between resistivity and doping concentration, (b) TEM results of the non-intentionally doped high-resistivity sample.
    (Color online) (a) XRD and (b) Raman tests of the sample at doping concentration 1018 cm−3.
    (Color online) The EBSD test results of the unintentionally doped samples (a)−(h), ranked by resistivity from high to low.
    (Color online) Grain size calculation results of the unintentionally doped samples (a)−(h), ranked by resistivity from high to low.
    (Color online) (a) EBSD data and (b) grain size of the nitrogen-doped sample.
    (Color online) The relationship between the grain size and resistivity of the unintentionally doped sample.
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    Guo Li, Lei Ge, Mingsheng Xu, Jisheng Han, Xiangang Xu. Effect of grain size on the resistivity of polycrystalline 3C-SiC[J]. Journal of Semiconductors, 2025, 46(8): 082502

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    Paper Information

    Category: Research Articles

    Received: Feb. 14, 2025

    Accepted: --

    Published Online: Aug. 27, 2025

    The Author Email: Lei Ge (LGe)

    DOI:10.1088/1674-4926/25020018

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