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Photonics Research, Volume. 10, Issue 2, 550(2022)

Influence of light pattern thickness on the manipulation of dielectric microparticles by optoelectronic tweezers

Shuailong Zhang1,2,3,4,5,9、*, Mohamed Elsayed4,5, Ran Peng6, Yujie Chen7, Yanfeng Zhang7, Steven L. Neale8, and Aaron R. Wheeler3,4,5,10、*
Author Affiliations
  • 1School of Mechatronical Engineering, Beijing Institute of Technology, Beijing 100081, China
  • 2Beijing Advanced Innovation Center for Intelligent Robots and Systems, Beijing Institute of Technology, Beijing 100081, China
  • 3Department of Chemistry, University of Toronto, Toronto, Ontario M5S 3H6, Canada
  • 4Institute of Biomedical Engineering, University of Toronto, Toronto, Ontario M5S 3G9, Canada
  • 5Donnelly Centre for Cellular and Biomolecular Research, University of Toronto, Toronto, Ontario M5S 3E1, Canada
  • 6Department of Marine Engineering, Dalian Maritime University, Dalian 116026, China
  • 7State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Sun Yat-sen University, Guangzhou 510275, China
  • 8James Watt School of Engineering, University of Glasgow, Glasgow G12 8QQ, UK
  • 9e-mail: shuailong.zhang@bit.edu.cn
  • 10e-mail: aaron.wheeler@utoronto.ca
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    Shuailong Zhang, Mohamed Elsayed, Ran Peng, Yujie Chen, Yanfeng Zhang, Steven L. Neale, Aaron R. Wheeler, "Influence of light pattern thickness on the manipulation of dielectric microparticles by optoelectronic tweezers," Photonics Res. 10, 550 (2022)

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    Paper Information

    Category: Instrumentation and Measurements

    Received: Jul. 14, 2021

    Accepted: Nov. 23, 2021

    Published Online: Jan. 26, 2022

    The Author Email: Shuailong Zhang (shuailong.zhang@bit.edu.cn), Aaron R. Wheeler (aaron.wheeler@utoronto.ca)

    DOI:10.1364/PRJ.437528

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology