[1] [1] Goetz A F H, Vane G, Solomon J E, et al. Science, 1985, 228: 1147.

[3] [3] Green R O. Applied Optics, 1998, 37(4): 683.

[7] [7] Xiong X, Chiang K, Esposito J, et al. Metrologia, 2003, 40: 89.

[8] [8] Immermann G, Neumann A, Siimnich H, et al. SPIE, 1993, 1937: 201.

[9] [9] Blechinger F, Charlton D E, Davancens R, et al. SPIE, 1993, 1937: 207.

[10] [10] Baudin G, Matthews S, Bessudo R, et al. SPIE, 1996, 2819: 141.

[11] [11] Labandibar J Y, Baudin G, Baillion Y. SPIE, 2004, 5234: 232.

[12] [12] Barry P S, Shepanski J, Segal C. SPIE, 2002, 4480: 231.

[13] [13] Werij H, Kruizinga B, Olij C, et al. SPIE, 1996, 2820: 126.

[14] [14] Cutter M A, Lobb D R, Williams T L, et al. SPIE, 1999, 3753: 180.

[15] [15] Delwart S, Huot J P, Bourg L. SPIE, 2003, 4881: 337.

[16] [16] Neville R A, Sun L, Staenz K. SPIE, 2003, 5093: 144.

[19] [19] Gao B C, Montes M J, Davis C O. Proceedings of the 11th JPL Airborne Earth Science Workshop, Robert O. Green, Editor, JPL Pub1. 03-4, 99-105, Jet Propulsion Laboratory, Pasadena, 2002.

[20] [20] Neville R A, Sun L, Staenz K. SPIE, 2003, 5093: 144.

[21] [21] Starks P J, Walter-Shea E A, Schiebe F R, et al. Remote Sens. Environ., 1995, 51: 385.

[22] [22] Martinsen P, Mcglone V A, Jordan R B, et al. Applied Spectroscopy, 2010, 64: 1325.

[23] [23] Salim S G R, Fox N P, Theocharous E, et al. Applied Optics, 2011, 50(6): 866.

[27] [27] Stoeckel G, Crompton D, Perron G. SPIE, 2007, 6675: 66750D.

[31] [31] Stoeckel G, Crompton D, Perron G. SPIE, 2007, 6675: 66750D.

[32] [32] Howard J M. SPIE, 2004, 5178: 82.