Thermally enhanced responsivity in an all-silicon optical power monitor based on defect-mediated absorption

Qikai Huang; Hui Yu; Qiang Zhang; Yan Li; Weiwei Chen; Yuehai Wang; Jianyi Yang

doi:10.1364/PRJ.432731

Photonics Research, Volume. 9, Issue 11, 2205(2021)

Thermally enhanced responsivity in an all-silicon optical power monitor based on defect-mediated absorption

Qikai Huang¹, Hui Yu^1,2、*, Qiang Zhang¹, Yan Li³, Weiwei Chen³, Yuehai Wang¹, and Jianyi Yang¹

¹Institute of Integrated Microelectronic Systems, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China

²Zhejiang Lab, Hangzhou 310027, China

³Faculty of Electrical Engineering and Computer Science, Ningbo University, Ningbo 315211, China

show less

Cited By

Article index updated: Jun. 15, 2025

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.

The article is cited by 6 article(s) from Web of Science.

The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Qikai Huang, Hui Yu, Qiang Zhang, Yan Li, Weiwei Chen, Yuehai Wang, Jianyi Yang, "Thermally enhanced responsivity in an all-silicon optical power monitor based on defect-mediated absorption," Photonics Res. 9, 2205 (2021)

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Integrated Optics

Received: May. 31, 2021

Accepted: Sep. 7, 2021

Published Online: Oct. 19, 2021

The Author Email: Hui Yu (huiyu@zju.edu.cn)

DOI:10.1364/PRJ.432731

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology