Record High-Power Narrow-Linewidth Fiber Laser Based on One-Stage Master Oscillator Power Amplification Configuration

Xiaoming Xi; Meng Wang; Xin Tian; Xiaofan Zhao; Binyu Rao; Peng Wang; Baolai Yang; Hanwei Zhang; Xiaolin Wang; Zefeng Wang; Jinbao Chen

doi:10.3788/CJL202249.1115001

Chinese Journal of Lasers, Volume. 49, Issue 11, 1115001(2022)

Record High-Power Narrow-Linewidth Fiber Laser Based on One-Stage Master Oscillator Power Amplification Configuration

Xiaoming Xi^1,2,3, Meng Wang^1,2,3, Xin Tian^1,2,3, Xiaofan Zhao^1,2,3, Binyu Rao^1,2,3, Peng Wang^1,2,3, Baolai Yang^1,2,3, Hanwei Zhang^1,2,3, Xiaolin Wang^1,2,3, Zefeng Wang^1,2,3、*, and Jinbao Chen^1,2,3

Author Affiliations

¹College of Advanced Interdisciplinary Studies, National University of Defense Technology, Changsha 410073, Hunan, China

²State Key Laboratory of Pulsed Power Laser Technology, Changsha 410073, Hunan, China

³Hunan Provincial Key Laboratory of High Energy Laser Technology, Changsha 410073, Hunan, China

show less

Abstract Get PDF(in Chinese)

References(1)

[3] Wang Y S, Ke W W, Peng W J et al. 3 kW, 0.2 nm narrow linewidth linearly polarized all-fiber laser based on a compact MOPA structure[J]. Laser Physics Letters, 17, 075101(2020).

Tools

Get Citation

Copy Citation Text

Xiaoming Xi, Meng Wang, Xin Tian, Xiaofan Zhao, Binyu Rao, Peng Wang, Baolai Yang, Hanwei Zhang, Xiaolin Wang, Zefeng Wang, Jinbao Chen. Record High-Power Narrow-Linewidth Fiber Laser Based on One-Stage Master Oscillator Power Amplification Configuration[J]. Chinese Journal of Lasers, 2022, 49(11): 1115001

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Letters

Received: Dec. 10, 2021

Accepted: Jan. 24, 2022

Published Online: Jun. 2, 2022

The Author Email: Wang Zefeng (zefengwang_nudt@163.com)

DOI:10.3788/CJL202249.1115001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology