Impact of Brillouin amplification on the spatial resolution of noise-correlated Brillouin optical reflectometry

Mingjiang Zhang; Xiaoyi Bao; Jing Chai; Yongning Zhang; Ruixia Liu; Hui Liu; Yi Liu; Jianzhong Zhang

doi:10.3788/COL201715.080603

Chinese Optics Letters, Volume. 15, Issue 8, 080603(2017)

Impact of Brillouin amplification on the spatial resolution of noise-correlated Brillouin optical reflectometry

Mingjiang Zhang^1,2,3、*, Xiaoyi Bao³, Jing Chai^1,2, Yongning Zhang^1,2, Ruixia Liu^1,2, Hui Liu^1,2, Yi Liu^1,2, and Jianzhong Zhang^1,2

Author Affiliations

¹Key Lab of Advanced Transducers and Intelligent Control Systems, Ministry of Education and Shanxi Province, Taiyuan 030024, China

²Institute of Optoelectronic Engineering, College of Physics & Optoelectronics, Taiyuan University of Technology, Taiyuan 030024, China

³Fiber Optics Group, Department of Physics, University of Ottawa, Ottawa K1N 6N5, Canada

show less

Cited By

Article index updated: Feb. 10, 2025

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.

The article is cited by 20 article(s) from Web of Science.

The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Mingjiang Zhang, Xiaoyi Bao, Jing Chai, Yongning Zhang, Ruixia Liu, Hui Liu, Yi Liu, Jianzhong Zhang, "Impact of Brillouin amplification on the spatial resolution of noise-correlated Brillouin optical reflectometry," Chin. Opt. Lett. 15, 080603 (2017)

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Fiber Optics and Optical Communications

Received: Jan. 24, 2017

Accepted: Apr. 21, 2017

Published Online: Jul. 20, 2018

The Author Email: Mingjiang Zhang (zhangmingjiang@tyut.edu.com)

DOI:10.3788/COL201715.080603

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology