High Power Laser Science and Engineering, Volume. 9, Issue 3, 03000e42(2021)
High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility
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Shengzhen Yi, Feng Zhang, Qiushi Huang, Lai Wei, Yuqiu Gu, Zhanshan Wang. High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility[J]. High Power Laser Science and Engineering, 2021, 9(3): 03000e42
Paper Information
Category: Research Articles
Received: Mar. 8, 2021
Accepted: May. 17, 2021
Published Online: Jul. 27, 2021
The Author Email: Zhanshan Wang (wangzs@tongji.edu.cn)
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